Cryogenic Electron Microscopy Focused Ion Beam Suite
Agency: | ENERGY, DEPARTMENT OF |
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Level of Government: | Federal |
Category: |
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Opps ID: | NBD00159309673388564 |
Posted Date: | Nov 30, 2022 |
Due Date: | Dec 14, 2022 |
Solicitation No: | SS-2023-2018 |
Source: | https://sam.gov/opp/20f2cfd89d... |
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- Contract Opportunity Type: Sources Sought (Original)
- All Dates/Times are: (UTC-07:00) MOUNTAIN STANDARD TIME, DENVER, USA
- Original Published Date: Nov 30, 2022 10:03 am MST
- Original Response Date: Dec 14, 2022 05:00 pm MST
- Inactive Policy: Manual
- Original Inactive Date: Dec 14, 2022
-
Initiative:
- None
- Original Set Aside:
- Product Service Code:
-
NAICS Code:
- 334516 - Analytical Laboratory Instrument Manufacturing
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Place of Performance:
Golden , CO 80401USA
NREL is seeking information from sources that may be capable of providing a commercial solution for the cryogenic electron microscopy FIB suite will be installed and operated within the Microscopy and Imaging Sciences group at NREL, in support of many projects and materials development across the entire laboratory. These tools will be operated by microscopy experts to support a growing base of qualified users on the tools. Samples vary from semiconductor devices, heterogenous devices, metals, polymers, electrodes, perovskites, and stacked combinations with and without electrolytes.
- PO BOX 4011 MAILSTOP RSF-041
- Golden , CO 80402
- USA
- Katherine Jungjohann
- katherine.jungjohann@nrel.gov
- Nov 30, 2022 10:03 am MSTSources Sought (Original)
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