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Suite of Focused Ion Beam and Scanning Electron Microscope Instruments

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Agency: COMMERCE, DEPARTMENT OF
Level of Government: Federal
Category:
  • 66 - Instruments and Laboratory Equipment
Opps ID: NBD00159774885550903
Posted Date: May 26, 2023
Due Date: Jun 16, 2023
Solicitation No: NB6800002300593
Source: https://sam.gov/opp/b051df39c1...
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Suite of Focused Ion Beam and Scanning Electron Microscope Instruments
Active
Contract Opportunity
Notice ID
NB6800002300593
Related Notice
NIST-SS23-CHIPS-0025
Department/Ind. Agency
COMMERCE, DEPARTMENT OF
Sub-tier
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office
DEPT OF COMMERCE NIST
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General Information View Changes
  • Contract Opportunity Type: Combined Synopsis/Solicitation (Updated)
  • All Dates/Times are: (UTC-04:00) EASTERN STANDARD TIME, NEW YORK, USA
  • Updated Published Date: May 26, 2023 04:59 pm EDT
  • Original Published Date: Mar 15, 2023 11:54 am EDT
  • Updated Date Offers Due: Jun 16, 2023 02:00 pm EDT
  • Original Date Offers Due: Mar 30, 2023 02:00 pm EDT
  • Inactive Policy: 15 days after date offers due
  • Updated Inactive Date: Jul 01, 2023
  • Original Inactive Date: Apr 14, 2023
  • Initiative:
    • None
Classification
  • Original Set Aside:
  • Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
  • NAICS Code:
    • 334516 - Analytical Laboratory Instrument Manufacturing
  • Place of Performance:
    Boulder , CO 80305
    USA
Description View Changes

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.



The solicitation number is NB680000-23-00593 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.



NIST is seeking a suite of three instruments from the same manufacturer:




  1. A focused ion beam/scanning electron microscope system specializing in high quality sample preparation

  2. A focused ion beam/scanning electron microscope system specializing in structural and chemical characterization of materials

  3. A scanning electron microscope system specializing in chemical and structural characterization of materials



SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.



- Amendment 0001 dated 15-MAR-2023 updates the SOW. All other terms and conditions remain unchanged.



- Amendment 0002 dated 28-MAR-2023 answers offeror questions, updates provisions and clauses through FAC 2023-02 dated March 16, 2023, and extends the quote due date. See Attachment 2 Q&A Set #1 dated March 28, 2023.



- Amendment 0003 dated 29-MAR-2023 updates and replaces Attachment 2 Q&A Set #1 to clarify previous Government responses.



- Amendment 0004 re-opens the solicitation and updates the statement of work. Requesting revised quotes in accordance with Amendment 0004.


Attachments/Links
Contact Information
Contracting Office Address
  • ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
  • GAITHERSBURG , MD 20899
  • USA
Primary Point of Contact
Secondary Point of Contact
History

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